In-line three-dimensional holography of nanocrystalline objects at atomic resolution

Resolution and sensitivity of the latest generation aberration-corrected transmission electron microscopes allow the vast majority of single atoms to be imaged with sub-Ångstrom resolution and their locations determined in an image plane with a precision that exceeds the 1.9-pm wavelength of 300 kV...

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Detalles Bibliográficos
Autores principales: Chen, F.-R., Van Dyck, D., Kisielowski, C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4759637/
https://www.ncbi.nlm.nih.gov/pubmed/26887849
http://dx.doi.org/10.1038/ncomms10603

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4759637/
https://www.ncbi.nlm.nih.gov/pubmed/26887849
http://dx.doi.org/10.1038/ncomms10603

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