Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing

A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles...

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Detalles Bibliográficos
Autores principales: Bergenholtz, Johan, Ulama, Jeanette, Zackrisson Oskolkova, Malin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4762572/
https://www.ncbi.nlm.nih.gov/pubmed/26937235
http://dx.doi.org/10.1107/S1600576715023444

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4762572/
https://www.ncbi.nlm.nih.gov/pubmed/26937235
http://dx.doi.org/10.1107/S1600576715023444

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