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Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing
A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4762572/ https://www.ncbi.nlm.nih.gov/pubmed/26937235 http://dx.doi.org/10.1107/S1600576715023444 |