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Cracks observed to propagate discontinuously on the millisecond timescale

Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.

Detalles Bibliográficos
Autor principal: Tanner, Brian K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4775155/
https://www.ncbi.nlm.nih.gov/pubmed/27006770
http://dx.doi.org/10.1107/S2052252516002359