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Cracks observed to propagate discontinuously on the millisecond timescale
Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.
Autor principal: | Tanner, Brian K. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4775155/ https://www.ncbi.nlm.nih.gov/pubmed/27006770 http://dx.doi.org/10.1107/S2052252516002359 |
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