Whole-pattern fitting technique in serial femtosecond nanocrystallography

Serial femtosecond X-ray crystallography (SFX) has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of ind...

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Detalles Bibliográficos
Autores principales: Dilanian, Ruben A., Williams, Sophie R., Martin, Andrew V., Streltsov, Victor A., Quiney, Harry M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4775161/
https://www.ncbi.nlm.nih.gov/pubmed/27006776
http://dx.doi.org/10.1107/S2052252516001238

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4775161/
https://www.ncbi.nlm.nih.gov/pubmed/27006776
http://dx.doi.org/10.1107/S2052252516001238

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