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Whole-pattern fitting technique in serial femtosecond nanocrystallography
Serial femtosecond X-ray crystallography (SFX) has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of ind...
Autores principales: | Dilanian, Ruben A., Williams, Sophie R., Martin, Andrew V., Streltsov, Victor A., Quiney, Harry M. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4775161/ https://www.ncbi.nlm.nih.gov/pubmed/27006776 http://dx.doi.org/10.1107/S2052252516001238 |
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