Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO(2)) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the perfor...

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Detalles Bibliográficos
Autores principales: Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, Yavaş, Hasan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787028/
https://www.ncbi.nlm.nih.gov/pubmed/26134800
http://dx.doi.org/10.1107/S1600577515009686

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787028/
https://www.ncbi.nlm.nih.gov/pubmed/26134800
http://dx.doi.org/10.1107/S1600577515009686

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