Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO(2)) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the perfor...

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Autores principales: Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, Yavaş, Hasan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787028/
https://www.ncbi.nlm.nih.gov/pubmed/26134800
http://dx.doi.org/10.1107/S1600577515009686
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author Ketenoglu, Didem
Harder, Manuel
Klementiev, Konstantin
Upton, Mary
Taherkhani, Mehran
Spiwek, Manfred
Dill, Frank-Uwe
Wille, Hans-Christian
Yavaş, Hasan
author_facet Ketenoglu, Didem
Harder, Manuel
Klementiev, Konstantin
Upton, Mary
Taherkhani, Mehran
Spiwek, Manfred
Dill, Frank-Uwe
Wille, Hans-Christian
Yavaş, Hasan
author_sort Ketenoglu, Didem
collection PubMed
description An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO(2)) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.
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spelling pubmed-47870282016-03-22 Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge Ketenoglu, Didem Harder, Manuel Klementiev, Konstantin Upton, Mary Taherkhani, Mehran Spiwek, Manfred Dill, Frank-Uwe Wille, Hans-Christian Yavaş, Hasan J Synchrotron Radiat Research Papers An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO(2)) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal. International Union of Crystallography 2015-06-27 /pmc/articles/PMC4787028/ /pubmed/26134800 http://dx.doi.org/10.1107/S1600577515009686 Text en © Didem Ketenoglu et al. 2015 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Ketenoglu, Didem
Harder, Manuel
Klementiev, Konstantin
Upton, Mary
Taherkhani, Mehran
Spiwek, Manfred
Dill, Frank-Uwe
Wille, Hans-Christian
Yavaş, Hasan
Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
title Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
title_full Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
title_fullStr Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
title_full_unstemmed Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
title_short Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge
title_sort resonant inelastic x-ray scattering spectrometer with 25 mev resolution at the cu k-edge
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787028/
https://www.ncbi.nlm.nih.gov/pubmed/26134800
http://dx.doi.org/10.1107/S1600577515009686
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