Laue-DIC: a new method for improved stress field measurements at the micrometer scale

A better understanding of the effective mechanical behavior of polycrystalline materials requires an accurate knowledge of the behavior at a scale smaller than the grain size. The X-ray Laue microdiffraction technique available at beamline BM32 at the European Synchrotron Radiation Facility is ideal...

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Detalles Bibliográficos
Autores principales: Petit, J., Castelnau, O., Bornert, M., Zhang, F. G., Hofmann, F., Korsunsky, A. M., Faurie, D., Le Bourlot, C., Micha, J. S., Robach, O., Ulrich, O.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787029/
https://www.ncbi.nlm.nih.gov/pubmed/26134802
http://dx.doi.org/10.1107/S1600577515005780

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787029/
https://www.ncbi.nlm.nih.gov/pubmed/26134802
http://dx.doi.org/10.1107/S1600577515005780

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