Shape Reconstruction Based on a New Blurring Model at the Micro/Nanometer Scale

Real-time observation of three-dimensional (3D) information has great significance in nanotechnology. However, normal nanometer scale observation techniques, including transmission electron microscopy (TEM), and scanning probe microscopy (SPM), have some problems to obtain 3D information because the...

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Detalles Bibliográficos
Autores principales: Wei, Yangjie, Wu, Chengdong, Wang, Wenxue
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4813877/
https://www.ncbi.nlm.nih.gov/pubmed/26927129
http://dx.doi.org/10.3390/s16030302

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4813877/
https://www.ncbi.nlm.nih.gov/pubmed/26927129
http://dx.doi.org/10.3390/s16030302

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