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Phase transitions via selective elemental vacancy engineering in complex oxide thin films
Defect engineering has brought about a unique level of control for Si-based semiconductors, leading to the optimization of various opto-electronic properties and devices. With regard to perovskite transition metal oxides, O vacancies have been a key ingredient in defect engineering, as they play a c...
Autores principales: | , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4817049/ https://www.ncbi.nlm.nih.gov/pubmed/27033718 http://dx.doi.org/10.1038/srep23649 |
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author | Lee, Sang A. Jeong, Hoidong Woo, Sungmin Hwang, Jae-Yeol Choi, Si-Young Kim, Sung-Dae Choi, Minseok Roh, Seulki Yu, Hosung Hwang, Jungseek Kim, Sung Wng Choi, Woo Seok |
author_facet | Lee, Sang A. Jeong, Hoidong Woo, Sungmin Hwang, Jae-Yeol Choi, Si-Young Kim, Sung-Dae Choi, Minseok Roh, Seulki Yu, Hosung Hwang, Jungseek Kim, Sung Wng Choi, Woo Seok |
author_sort | Lee, Sang A. |
collection | PubMed |
description | Defect engineering has brought about a unique level of control for Si-based semiconductors, leading to the optimization of various opto-electronic properties and devices. With regard to perovskite transition metal oxides, O vacancies have been a key ingredient in defect engineering, as they play a central role in determining the crystal field and consequent electronic structure, leading to important electronic and magnetic phase transitions. Therefore, experimental approaches toward understanding the role of defects in complex oxides have been largely limited to controlling O vacancies. In this study, we report on the selective formation of different types of elemental vacancies and their individual roles in determining the atomic and electronic structures of perovskite SrTiO(3) (STO) homoepitaxial thin films fabricated by pulsed laser epitaxy. Structural and electronic transitions have been achieved via selective control of the Sr and O vacancy concentrations, respectively, indicating a decoupling between the two phase transitions. In particular, O vacancies were responsible for metal-insulator transitions, but did not influence the Sr vacancy induced cubic-to-tetragonal structural transition in epitaxial STO thin film. The independent control of multiple phase transitions in complex oxides by exploiting selective vacancy engineering opens up an unprecedented opportunity toward understanding and customizing complex oxide thin films. |
format | Online Article Text |
id | pubmed-4817049 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-48170492016-04-05 Phase transitions via selective elemental vacancy engineering in complex oxide thin films Lee, Sang A. Jeong, Hoidong Woo, Sungmin Hwang, Jae-Yeol Choi, Si-Young Kim, Sung-Dae Choi, Minseok Roh, Seulki Yu, Hosung Hwang, Jungseek Kim, Sung Wng Choi, Woo Seok Sci Rep Article Defect engineering has brought about a unique level of control for Si-based semiconductors, leading to the optimization of various opto-electronic properties and devices. With regard to perovskite transition metal oxides, O vacancies have been a key ingredient in defect engineering, as they play a central role in determining the crystal field and consequent electronic structure, leading to important electronic and magnetic phase transitions. Therefore, experimental approaches toward understanding the role of defects in complex oxides have been largely limited to controlling O vacancies. In this study, we report on the selective formation of different types of elemental vacancies and their individual roles in determining the atomic and electronic structures of perovskite SrTiO(3) (STO) homoepitaxial thin films fabricated by pulsed laser epitaxy. Structural and electronic transitions have been achieved via selective control of the Sr and O vacancy concentrations, respectively, indicating a decoupling between the two phase transitions. In particular, O vacancies were responsible for metal-insulator transitions, but did not influence the Sr vacancy induced cubic-to-tetragonal structural transition in epitaxial STO thin film. The independent control of multiple phase transitions in complex oxides by exploiting selective vacancy engineering opens up an unprecedented opportunity toward understanding and customizing complex oxide thin films. Nature Publishing Group 2016-04-01 /pmc/articles/PMC4817049/ /pubmed/27033718 http://dx.doi.org/10.1038/srep23649 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Lee, Sang A. Jeong, Hoidong Woo, Sungmin Hwang, Jae-Yeol Choi, Si-Young Kim, Sung-Dae Choi, Minseok Roh, Seulki Yu, Hosung Hwang, Jungseek Kim, Sung Wng Choi, Woo Seok Phase transitions via selective elemental vacancy engineering in complex oxide thin films |
title | Phase transitions via selective elemental vacancy engineering in complex oxide thin films |
title_full | Phase transitions via selective elemental vacancy engineering in complex oxide thin films |
title_fullStr | Phase transitions via selective elemental vacancy engineering in complex oxide thin films |
title_full_unstemmed | Phase transitions via selective elemental vacancy engineering in complex oxide thin films |
title_short | Phase transitions via selective elemental vacancy engineering in complex oxide thin films |
title_sort | phase transitions via selective elemental vacancy engineering in complex oxide thin films |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4817049/ https://www.ncbi.nlm.nih.gov/pubmed/27033718 http://dx.doi.org/10.1038/srep23649 |
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