Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy

For the structural characterization of the polystyrene (PS)-based photonic crystals (PCs), fast and direct imaging capabilities of full field transmission X-ray microscopy (TXM) were demonstrated at soft X-ray energy. PS-based PCs were prepared on an O(2)-plasma treated Si(3)N(4) window and their lo...

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Detalles Bibliográficos
Autores principales: Nho, Hyun Woo, Kalegowda, Yogesh, Shin, Hyun-Joon, Yoon, Tae Hyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4834481/
https://www.ncbi.nlm.nih.gov/pubmed/27087141
http://dx.doi.org/10.1038/srep24488

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4834481/
https://www.ncbi.nlm.nih.gov/pubmed/27087141
http://dx.doi.org/10.1038/srep24488

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