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High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
We have constructed a new facility at the National Institute of Standards and Technology (NIST) to measure the index of refraction of transmissive materials in the wavelength range from the visible to the vacuum ultraviolet. An etalon of the material is illuminated with synchrotron radiation, and th...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2003
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4844516/ https://www.ncbi.nlm.nih.gov/pubmed/27413620 http://dx.doi.org/10.6028/jres.108.037 |