Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers

The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam diffractometers. The refined parameters are...

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Detalles Bibliográficos
Autores principales: Cheary, R. W., Coelho, A. A., Cline, J. P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2004
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4849620/
https://www.ncbi.nlm.nih.gov/pubmed/27366594
http://dx.doi.org/10.6028/jres.109.002

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4849620/
https://www.ncbi.nlm.nih.gov/pubmed/27366594
http://dx.doi.org/10.6028/jres.109.002

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