Cargando…
Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers
The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam diffractometers. The refined parameters are...
Autores principales: | Cheary, R. W., Coelho, A. A., Cline, J. P. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2004
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4849620/ https://www.ncbi.nlm.nih.gov/pubmed/27366594 http://dx.doi.org/10.6028/jres.109.002 |
Ejemplares similares
-
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials
por: Cline, James P., et al.
Publicado: (2015) -
A NEW FORM OF DIFFRACTOMETER
por: Cox, Richard T., et al.
Publicado: (1941) -
An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line Profiles
por: Mendenhall, Marcus H., et al.
Publicado: (2015) -
A multipurpose laboratory diffractometer for operando powder X-ray diffraction investigations of energy materials
por: Geßwein, Holger, et al.
Publicado: (2022) -
An X-ray diffractometer using mirage diffraction
por: Fukamachi, Tomoe, et al.
Publicado: (2014)