In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude

The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust...

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Detalles Bibliográficos
Autores principales: de Laat, Marcel Lambertus Cornelis, Pérez Garza, Héctor Hugo, Ghatkesar, Murali Krishna
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4851037/
https://www.ncbi.nlm.nih.gov/pubmed/27077863
http://dx.doi.org/10.3390/s16040523

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4851037/
https://www.ncbi.nlm.nih.gov/pubmed/27077863
http://dx.doi.org/10.3390/s16040523

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