Cargando…
In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude
The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust...
Autores principales: | , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2016
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4851037/ https://www.ncbi.nlm.nih.gov/pubmed/27077863 http://dx.doi.org/10.3390/s16040523 |
_version_ | 1782429762058190848 |
---|---|
author | de Laat, Marcel Lambertus Cornelis Pérez Garza, Héctor Hugo Ghatkesar, Murali Krishna |
author_facet | de Laat, Marcel Lambertus Cornelis Pérez Garza, Héctor Hugo Ghatkesar, Murali Krishna |
author_sort | de Laat, Marcel Lambertus Cornelis |
collection | PubMed |
description | The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust the stiffness in situ of a commercial AFM cantilever is developed. The adjustment is achieved by changing the effective length of the cantilever by electrostatic pull-in. By applying a voltage between the cantilever and an electrode (with an insulating layer at the point of contact), the cantilever snaps to the electrode, reducing the cantilever’s effective length. An analytical model was developed to find the pull-in voltage of the system. Subsequently, a finite element model was developed to study the pull-in behavior. The working principle of this concept is demonstrated with a proof-of-concept experiment. The electrode was positioned close to the cantilever by using a robotic nanomanipulator. To confirm the change in stiffness, the fundamental resonance frequency of the cantilever was measured for varying electrode positions. The results match with the theoretical expectations. The stiffness was adjusted in situ in the range of 0.2 N/m to 27 N/m, covering two orders of magnitude in one single cantilever. This proof-of-concept is the first step towards a micro fabricated prototype, that integrates the electrode positioning system and cantilever that can be used for actual AFM experiments. |
format | Online Article Text |
id | pubmed-4851037 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-48510372016-05-04 In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude de Laat, Marcel Lambertus Cornelis Pérez Garza, Héctor Hugo Ghatkesar, Murali Krishna Sensors (Basel) Article The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust the stiffness in situ of a commercial AFM cantilever is developed. The adjustment is achieved by changing the effective length of the cantilever by electrostatic pull-in. By applying a voltage between the cantilever and an electrode (with an insulating layer at the point of contact), the cantilever snaps to the electrode, reducing the cantilever’s effective length. An analytical model was developed to find the pull-in voltage of the system. Subsequently, a finite element model was developed to study the pull-in behavior. The working principle of this concept is demonstrated with a proof-of-concept experiment. The electrode was positioned close to the cantilever by using a robotic nanomanipulator. To confirm the change in stiffness, the fundamental resonance frequency of the cantilever was measured for varying electrode positions. The results match with the theoretical expectations. The stiffness was adjusted in situ in the range of 0.2 N/m to 27 N/m, covering two orders of magnitude in one single cantilever. This proof-of-concept is the first step towards a micro fabricated prototype, that integrates the electrode positioning system and cantilever that can be used for actual AFM experiments. MDPI 2016-04-12 /pmc/articles/PMC4851037/ /pubmed/27077863 http://dx.doi.org/10.3390/s16040523 Text en © 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons by Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article de Laat, Marcel Lambertus Cornelis Pérez Garza, Héctor Hugo Ghatkesar, Murali Krishna In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude |
title | In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude |
title_full | In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude |
title_fullStr | In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude |
title_full_unstemmed | In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude |
title_short | In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude |
title_sort | in situ stiffness adjustment of afm probes by two orders of magnitude |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4851037/ https://www.ncbi.nlm.nih.gov/pubmed/27077863 http://dx.doi.org/10.3390/s16040523 |
work_keys_str_mv | AT delaatmarcellambertuscornelis insitustiffnessadjustmentofafmprobesbytwoordersofmagnitude AT perezgarzahectorhugo insitustiffnessadjustmentofafmprobesbytwoordersofmagnitude AT ghatkesarmuralikrishna insitustiffnessadjustmentofafmprobesbytwoordersofmagnitude |