Comparison of two high-throughput semiconductor chip sequencing platforms in noninvasive prenatal testing for Down syndrome in early pregnancy

BACKGROUND: Noninvasive prenatal testing (NIPT) to detect fetal aneuploidy using next-generation sequencing on ion semiconductor platforms has become common. There are several sequencers that can generate sufficient DNA reads for NIPT. However, the approval criteria vary among platforms and countrie...

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Detalles Bibliográficos
Autores principales: Kim, Sunshin, Jung, HeeJung, Han, Sung Hee, Lee, SeungJae, Kwon, JeongSub, Kim, Min Gyun, Chu, Hyungsik, Chen, Hongliang, Han, Kyudong, Kwak, Hwanjong, Park, Sunghoon, Joo, Hee Jae, Kim, Byung Chul, Bhak, Jong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2016
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4851803/
https://www.ncbi.nlm.nih.gov/pubmed/27129388
http://dx.doi.org/10.1186/s12920-016-0182-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4851803/
https://www.ncbi.nlm.nih.gov/pubmed/27129388
http://dx.doi.org/10.1186/s12920-016-0182-9

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