Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films

Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnit...

Descripción completa

Detalles Bibliográficos
Autores principales: Resel, Roland, Bainschab, Markus, Pichler, Alexander, Dingemans, Theo, Simbrunner, Clemens, Stangl, Julian, Salzmann, Ingo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4853871/
https://www.ncbi.nlm.nih.gov/pubmed/27140152
http://dx.doi.org/10.1107/S1600577516003672

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4853871/
https://www.ncbi.nlm.nih.gov/pubmed/27140152
http://dx.doi.org/10.1107/S1600577516003672

Ejemplares similares