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Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films

Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnit...

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Autores principales: Resel, Roland, Bainschab, Markus, Pichler, Alexander, Dingemans, Theo, Simbrunner, Clemens, Stangl, Julian, Salzmann, Ingo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4853871/
https://www.ncbi.nlm.nih.gov/pubmed/27140152
http://dx.doi.org/10.1107/S1600577516003672
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author Resel, Roland
Bainschab, Markus
Pichler, Alexander
Dingemans, Theo
Simbrunner, Clemens
Stangl, Julian
Salzmann, Ingo
author_facet Resel, Roland
Bainschab, Markus
Pichler, Alexander
Dingemans, Theo
Simbrunner, Clemens
Stangl, Julian
Salzmann, Ingo
author_sort Resel, Roland
collection PubMed
description Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films.
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spelling pubmed-48538712016-05-06 Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films Resel, Roland Bainschab, Markus Pichler, Alexander Dingemans, Theo Simbrunner, Clemens Stangl, Julian Salzmann, Ingo J Synchrotron Radiat Research Papers Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films. International Union of Crystallography 2016-04-20 /pmc/articles/PMC4853871/ /pubmed/27140152 http://dx.doi.org/10.1107/S1600577516003672 Text en © Roland Resel et al. 2016 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Resel, Roland
Bainschab, Markus
Pichler, Alexander
Dingemans, Theo
Simbrunner, Clemens
Stangl, Julian
Salzmann, Ingo
Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films
title Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films
title_full Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films
title_fullStr Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films
title_full_unstemmed Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films
title_short Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films
title_sort multiple scattering in grazing-incidence x-ray diffraction: impact on lattice-constant determination in thin films
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4853871/
https://www.ncbi.nlm.nih.gov/pubmed/27140152
http://dx.doi.org/10.1107/S1600577516003672
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