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Electromigration in Gold Films on Flexible Polyimide Substrates as a Self-healing Mechanism
The study of electromigration (EM) in metallisations for flexible thin film systems has not been a major concern due to low applied current densities in today's flexible electronic devices. However, the trend towards smaller and more powerful devices demands increasing current densities for fut...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Taylor & Francis
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4854219/ https://www.ncbi.nlm.nih.gov/pubmed/27158564 http://dx.doi.org/10.1080/21663831.2015.1105876 |