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Electromigration in Gold Films on Flexible Polyimide Substrates as a Self-healing Mechanism

The study of electromigration (EM) in metallisations for flexible thin film systems has not been a major concern due to low applied current densities in today's flexible electronic devices. However, the trend towards smaller and more powerful devices demands increasing current densities for fut...

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Detalles Bibliográficos
Autores principales: Putz, Barbara, Glushko, Oleksandr, Cordill, Megan J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4854219/
https://www.ncbi.nlm.nih.gov/pubmed/27158564
http://dx.doi.org/10.1080/21663831.2015.1105876