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Uncertainties in Small-Angle Measurement Systems Used to Calibrate Angle Artifacts
We have studied a number of effects that can give rise to errors in small-angle measurement systems when they are used to calibrate artifacts such as optical polygons. Of these sources of uncertainty, the most difficult to quantify are errors associated with the measurement of imperfect, non-flat fa...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2004
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4854320/ https://www.ncbi.nlm.nih.gov/pubmed/27366616 http://dx.doi.org/10.6028/jres.109.024 |