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De novo phasing with optimized XFEL data
Nass et al. [IUCrJ (2016), 3, 180–191] have demonstrated that serial femtosecond crystallography (SFX) data collected at X-ray free-electron lasers (XFELs) can be successfully phased using only the weak anomalous scattering from the native S atoms.
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2016
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4856137/ https://www.ncbi.nlm.nih.gov/pubmed/27158501 http://dx.doi.org/10.1107/S2052252516006758 |