Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad. 21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved anal...

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Detalles Bibliográficos
Autores principales: Honkanen, Ari-Pekka, Verbeni, Roberto, Simonelli, Laura, Moretti Sala, Marco, Al-Zein, Ali, Krisch, Michael, Monaco, Giulio, Huotari, Simo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2014
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4861880/
https://www.ncbi.nlm.nih.gov/pubmed/24971972
http://dx.doi.org/10.1107/S1600577514011163

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4861880/
https://www.ncbi.nlm.nih.gov/pubmed/24971972
http://dx.doi.org/10.1107/S1600577514011163

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