Decomposition of Wavelength Dispersive X-Ray Spectra

Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-d...

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Detalles Bibliográficos
Autores principales: Rémond, Guy, Myklebust, Robert, Fialin, Michel, Nockolds, Clive, Phillips, Matthew, Roques-Carmes, Claude
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2002
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863852/
https://www.ncbi.nlm.nih.gov/pubmed/27446750
http://dx.doi.org/10.6028/jres.107.044

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863852/
https://www.ncbi.nlm.nih.gov/pubmed/27446750
http://dx.doi.org/10.6028/jres.107.044

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