Accurate Cross Sections for Microanalysis
To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest an...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2002
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863853/ https://www.ncbi.nlm.nih.gov/pubmed/27446747 http://dx.doi.org/10.6028/jres.107.041 |
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author | Rez, Peter |
author_facet | Rez, Peter |
author_sort | Rez, Peter |
collection | PubMed |
description | To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest and the absorption coefficient of the x rays on the path to the detector. The theoretical predictions and experimental data available for ionization cross sections are limited mainly to K shells of a few elements. Results of systematic plane wave Born approximation calculations with exchange for K, L, and M shell ionization cross sections over the range of electron energies used in microanalysis are presented. Comparisons are made with experimental measurement for selected K shells and it is shown that the plane wave theory is not appropriate for overvoltages less than 2.5 V. |
format | Online Article Text |
id | pubmed-4863853 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2002 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-48638532016-07-21 Accurate Cross Sections for Microanalysis Rez, Peter J Res Natl Inst Stand Technol Article To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest and the absorption coefficient of the x rays on the path to the detector. The theoretical predictions and experimental data available for ionization cross sections are limited mainly to K shells of a few elements. Results of systematic plane wave Born approximation calculations with exchange for K, L, and M shell ionization cross sections over the range of electron energies used in microanalysis are presented. Comparisons are made with experimental measurement for selected K shells and it is shown that the plane wave theory is not appropriate for overvoltages less than 2.5 V. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2002 2002-12-01 /pmc/articles/PMC4863853/ /pubmed/27446747 http://dx.doi.org/10.6028/jres.107.041 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Rez, Peter Accurate Cross Sections for Microanalysis |
title | Accurate Cross Sections for Microanalysis |
title_full | Accurate Cross Sections for Microanalysis |
title_fullStr | Accurate Cross Sections for Microanalysis |
title_full_unstemmed | Accurate Cross Sections for Microanalysis |
title_short | Accurate Cross Sections for Microanalysis |
title_sort | accurate cross sections for microanalysis |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863853/ https://www.ncbi.nlm.nih.gov/pubmed/27446747 http://dx.doi.org/10.6028/jres.107.041 |
work_keys_str_mv | AT rezpeter accuratecrosssectionsformicroanalysis |