Accurate Cross Sections for Microanalysis

To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest an...

Descripción completa

Detalles Bibliográficos
Autor principal: Rez, Peter
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2002
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863853/
https://www.ncbi.nlm.nih.gov/pubmed/27446747
http://dx.doi.org/10.6028/jres.107.041
_version_ 1782431549012049920
author Rez, Peter
author_facet Rez, Peter
author_sort Rez, Peter
collection PubMed
description To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest and the absorption coefficient of the x rays on the path to the detector. The theoretical predictions and experimental data available for ionization cross sections are limited mainly to K shells of a few elements. Results of systematic plane wave Born approximation calculations with exchange for K, L, and M shell ionization cross sections over the range of electron energies used in microanalysis are presented. Comparisons are made with experimental measurement for selected K shells and it is shown that the plane wave theory is not appropriate for overvoltages less than 2.5 V.
format Online
Article
Text
id pubmed-4863853
institution National Center for Biotechnology Information
language English
publishDate 2002
publisher [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
record_format MEDLINE/PubMed
spelling pubmed-48638532016-07-21 Accurate Cross Sections for Microanalysis Rez, Peter J Res Natl Inst Stand Technol Article To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest and the absorption coefficient of the x rays on the path to the detector. The theoretical predictions and experimental data available for ionization cross sections are limited mainly to K shells of a few elements. Results of systematic plane wave Born approximation calculations with exchange for K, L, and M shell ionization cross sections over the range of electron energies used in microanalysis are presented. Comparisons are made with experimental measurement for selected K shells and it is shown that the plane wave theory is not appropriate for overvoltages less than 2.5 V. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2002 2002-12-01 /pmc/articles/PMC4863853/ /pubmed/27446747 http://dx.doi.org/10.6028/jres.107.041 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Rez, Peter
Accurate Cross Sections for Microanalysis
title Accurate Cross Sections for Microanalysis
title_full Accurate Cross Sections for Microanalysis
title_fullStr Accurate Cross Sections for Microanalysis
title_full_unstemmed Accurate Cross Sections for Microanalysis
title_short Accurate Cross Sections for Microanalysis
title_sort accurate cross sections for microanalysis
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863853/
https://www.ncbi.nlm.nih.gov/pubmed/27446747
http://dx.doi.org/10.6028/jres.107.041
work_keys_str_mv AT rezpeter accuratecrosssectionsformicroanalysis