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Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Crystallographic Association
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4866961/ https://www.ncbi.nlm.nih.gov/pubmed/27226978 http://dx.doi.org/10.1063/1.4949538 |