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Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Crystallographic Association
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4866961/ https://www.ncbi.nlm.nih.gov/pubmed/27226978 http://dx.doi.org/10.1063/1.4949538 |
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author | Badali, D. S. Gengler, R. Y. N. Miller, R. J. D. |
author_facet | Badali, D. S. Gengler, R. Y. N. Miller, R. J. D. |
author_sort | Badali, D. S. |
collection | PubMed |
description | A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples. |
format | Online Article Text |
id | pubmed-4866961 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | American Crystallographic Association |
record_format | MEDLINE/PubMed |
spelling | pubmed-48669612016-05-25 Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers Badali, D. S. Gengler, R. Y. N. Miller, R. J. D. Struct Dyn ARTICLES A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples. American Crystallographic Association 2016-05-12 /pmc/articles/PMC4866961/ /pubmed/27226978 http://dx.doi.org/10.1063/1.4949538 Text en © 2016 Author(s). 2329-7778/2016/3(3)/034302/10 All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | ARTICLES Badali, D. S. Gengler, R. Y. N. Miller, R. J. D. Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers |
title | Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers |
title_full | Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers |
title_fullStr | Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers |
title_full_unstemmed | Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers |
title_short | Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers |
title_sort | ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers |
topic | ARTICLES |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4866961/ https://www.ncbi.nlm.nih.gov/pubmed/27226978 http://dx.doi.org/10.1063/1.4949538 |
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