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Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers

A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10...

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Detalles Bibliográficos
Autores principales: Badali, D. S., Gengler, R. Y. N., Miller, R. J. D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4866961/
https://www.ncbi.nlm.nih.gov/pubmed/27226978
http://dx.doi.org/10.1063/1.4949538
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author Badali, D. S.
Gengler, R. Y. N.
Miller, R. J. D.
author_facet Badali, D. S.
Gengler, R. Y. N.
Miller, R. J. D.
author_sort Badali, D. S.
collection PubMed
description A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples.
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spelling pubmed-48669612016-05-25 Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers Badali, D. S. Gengler, R. Y. N. Miller, R. J. D. Struct Dyn ARTICLES A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples. American Crystallographic Association 2016-05-12 /pmc/articles/PMC4866961/ /pubmed/27226978 http://dx.doi.org/10.1063/1.4949538 Text en © 2016 Author(s). 2329-7778/2016/3(3)/034302/10 All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle ARTICLES
Badali, D. S.
Gengler, R. Y. N.
Miller, R. J. D.
Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
title Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
title_full Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
title_fullStr Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
title_full_unstemmed Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
title_short Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
title_sort ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
topic ARTICLES
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4866961/
https://www.ncbi.nlm.nih.gov/pubmed/27226978
http://dx.doi.org/10.1063/1.4949538
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