IOTA: integration optimization, triage and analysis tool for the processing of XFEL diffraction images

Serial femtosecond crystallography (SFX) uses an X-ray free-electron laser to extract diffraction data from crystals not amenable to conventional X-ray light sources owing to their small size or radiation sensitivity. However, a limitation of SFX is the high variability of the diffraction images tha...

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Detalles Bibliográficos
Autores principales: Lyubimov, Artem Y., Uervirojnangkoorn, Monarin, Zeldin, Oliver B., Brewster, Aaron S., Murray, Thomas D., Sauter, Nicholas K., Berger, James M., Weis, William I., Brunger, Axel T.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Computer Programs
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4886991/
https://www.ncbi.nlm.nih.gov/pubmed/27275148
http://dx.doi.org/10.1107/S1600576716006683

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4886991/
https://www.ncbi.nlm.nih.gov/pubmed/27275148
http://dx.doi.org/10.1107/S1600576716006683

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