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IOTA: integration optimization, triage and analysis tool for the processing of XFEL diffraction images
Serial femtosecond crystallography (SFX) uses an X-ray free-electron laser to extract diffraction data from crystals not amenable to conventional X-ray light sources owing to their small size or radiation sensitivity. However, a limitation of SFX is the high variability of the diffraction images tha...
Autores principales: | Lyubimov, Artem Y., Uervirojnangkoorn, Monarin, Zeldin, Oliver B., Brewster, Aaron S., Murray, Thomas D., Sauter, Nicholas K., Berger, James M., Weis, William I., Brunger, Axel T. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4886991/ https://www.ncbi.nlm.nih.gov/pubmed/27275148 http://dx.doi.org/10.1107/S1600576716006683 |
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