Optical diffraction for measurements of nano-mechanical bending

We explore and exploit diffraction effects that have been previously neglected when modelling optical measurement techniques for the bending of micro-mechanical transducers such as cantilevers for atomic force microscopy. The illumination of a cantilever edge causes an asymmetric diffraction pattern...

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Detalles Bibliográficos
Autores principales: Hermans, Rodolfo I., Dueck, Benjamin, Ndieyira, Joseph Wafula, McKendry, Rachel A., Aeppli, Gabriel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4891711/
https://www.ncbi.nlm.nih.gov/pubmed/27255427
http://dx.doi.org/10.1038/srep26690

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4891711/
https://www.ncbi.nlm.nih.gov/pubmed/27255427
http://dx.doi.org/10.1038/srep26690

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