Cargando…

Defect engineering of the electronic transport through cuprous oxide interlayers

The electronic transport through Au–(Cu(2)O)(n)–Au junctions is investigated using first-principles calculations and the nonequilibrium Green’s function method. The effect of varying the thickness (i.e., n) is studied as well as that of point defects and anion substitution. For all Cu(2)O thicknesse...

Descripción completa

Detalles Bibliográficos
Autores principales: Fadlallah, Mohamed M., Eckern, Ulrich, Schwingenschlögl, Udo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4891735/
https://www.ncbi.nlm.nih.gov/pubmed/27256905
http://dx.doi.org/10.1038/srep27049