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Defect engineering of the electronic transport through cuprous oxide interlayers
The electronic transport through Au–(Cu(2)O)(n)–Au junctions is investigated using first-principles calculations and the nonequilibrium Green’s function method. The effect of varying the thickness (i.e., n) is studied as well as that of point defects and anion substitution. For all Cu(2)O thicknesse...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4891735/ https://www.ncbi.nlm.nih.gov/pubmed/27256905 http://dx.doi.org/10.1038/srep27049 |