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Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout
In order to acquire radiation-tolerant characteristics in integrated circuits, a dummy gate-assisted n-type metal oxide semiconductor field effect transistor (DGA n-MOSFET) layout was adopted. The DGA n-MOSFET has a different channel shape compared with the standard n-MOSFET. The standard n-MOSFET h...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Hindawi Publishing Corporation
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4897586/ https://www.ncbi.nlm.nih.gov/pubmed/27350975 http://dx.doi.org/10.1155/2014/145759 |
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author | Lee, Min Su Lee, Hee Chul |
author_facet | Lee, Min Su Lee, Hee Chul |
author_sort | Lee, Min Su |
collection | PubMed |
description | In order to acquire radiation-tolerant characteristics in integrated circuits, a dummy gate-assisted n-type metal oxide semiconductor field effect transistor (DGA n-MOSFET) layout was adopted. The DGA n-MOSFET has a different channel shape compared with the standard n-MOSFET. The standard n-MOSFET has a rectangular channel shape, whereas the DGA n-MOSFET has an extended rectangular shape at the edge of the source and drain, which affects its aspect ratio. In order to increase its practical use, a new aspect ratio model is proposed for the DGA n-MOSFET and this model is evaluated through three-dimensional simulations and measurements of the fabricated devices. The proposed aspect ratio model for the DGA n-MOSFET exhibits good agreement with the simulation and measurement results. |
format | Online Article Text |
id | pubmed-4897586 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2014 |
publisher | Hindawi Publishing Corporation |
record_format | MEDLINE/PubMed |
spelling | pubmed-48975862016-06-27 Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout Lee, Min Su Lee, Hee Chul Int Sch Res Notices Research Article In order to acquire radiation-tolerant characteristics in integrated circuits, a dummy gate-assisted n-type metal oxide semiconductor field effect transistor (DGA n-MOSFET) layout was adopted. The DGA n-MOSFET has a different channel shape compared with the standard n-MOSFET. The standard n-MOSFET has a rectangular channel shape, whereas the DGA n-MOSFET has an extended rectangular shape at the edge of the source and drain, which affects its aspect ratio. In order to increase its practical use, a new aspect ratio model is proposed for the DGA n-MOSFET and this model is evaluated through three-dimensional simulations and measurements of the fabricated devices. The proposed aspect ratio model for the DGA n-MOSFET exhibits good agreement with the simulation and measurement results. Hindawi Publishing Corporation 2014-11-17 /pmc/articles/PMC4897586/ /pubmed/27350975 http://dx.doi.org/10.1155/2014/145759 Text en Copyright © 2014 M. S. Lee and H. C. Lee. https://creativecommons.org/licenses/by/3.0/ This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
spellingShingle | Research Article Lee, Min Su Lee, Hee Chul Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout |
title | Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout |
title_full | Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout |
title_fullStr | Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout |
title_full_unstemmed | Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout |
title_short | Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout |
title_sort | aspect ratio model for radiation-tolerant dummy gate-assisted n-mosfet layout |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4897586/ https://www.ncbi.nlm.nih.gov/pubmed/27350975 http://dx.doi.org/10.1155/2014/145759 |
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