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Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout

In order to acquire radiation-tolerant characteristics in integrated circuits, a dummy gate-assisted n-type metal oxide semiconductor field effect transistor (DGA n-MOSFET) layout was adopted. The DGA n-MOSFET has a different channel shape compared with the standard n-MOSFET. The standard n-MOSFET h...

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Detalles Bibliográficos
Autores principales: Lee, Min Su, Lee, Hee Chul
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4897586/
https://www.ncbi.nlm.nih.gov/pubmed/27350975
http://dx.doi.org/10.1155/2014/145759
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author Lee, Min Su
Lee, Hee Chul
author_facet Lee, Min Su
Lee, Hee Chul
author_sort Lee, Min Su
collection PubMed
description In order to acquire radiation-tolerant characteristics in integrated circuits, a dummy gate-assisted n-type metal oxide semiconductor field effect transistor (DGA n-MOSFET) layout was adopted. The DGA n-MOSFET has a different channel shape compared with the standard n-MOSFET. The standard n-MOSFET has a rectangular channel shape, whereas the DGA n-MOSFET has an extended rectangular shape at the edge of the source and drain, which affects its aspect ratio. In order to increase its practical use, a new aspect ratio model is proposed for the DGA n-MOSFET and this model is evaluated through three-dimensional simulations and measurements of the fabricated devices. The proposed aspect ratio model for the DGA n-MOSFET exhibits good agreement with the simulation and measurement results.
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spelling pubmed-48975862016-06-27 Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout Lee, Min Su Lee, Hee Chul Int Sch Res Notices Research Article In order to acquire radiation-tolerant characteristics in integrated circuits, a dummy gate-assisted n-type metal oxide semiconductor field effect transistor (DGA n-MOSFET) layout was adopted. The DGA n-MOSFET has a different channel shape compared with the standard n-MOSFET. The standard n-MOSFET has a rectangular channel shape, whereas the DGA n-MOSFET has an extended rectangular shape at the edge of the source and drain, which affects its aspect ratio. In order to increase its practical use, a new aspect ratio model is proposed for the DGA n-MOSFET and this model is evaluated through three-dimensional simulations and measurements of the fabricated devices. The proposed aspect ratio model for the DGA n-MOSFET exhibits good agreement with the simulation and measurement results. Hindawi Publishing Corporation 2014-11-17 /pmc/articles/PMC4897586/ /pubmed/27350975 http://dx.doi.org/10.1155/2014/145759 Text en Copyright © 2014 M. S. Lee and H. C. Lee. https://creativecommons.org/licenses/by/3.0/ This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Research Article
Lee, Min Su
Lee, Hee Chul
Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout
title Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout
title_full Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout
title_fullStr Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout
title_full_unstemmed Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout
title_short Aspect Ratio Model for Radiation-Tolerant Dummy Gate-Assisted n-MOSFET Layout
title_sort aspect ratio model for radiation-tolerant dummy gate-assisted n-mosfet layout
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4897586/
https://www.ncbi.nlm.nih.gov/pubmed/27350975
http://dx.doi.org/10.1155/2014/145759
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