Determination of the compositions of the DIGM zone in nanocrystalline Ag/Au and Ag/Pd thin films by secondary neutral mass spectrometry

Alloying by grain boundary diffusion-induced grain boundary migration is investigated by secondary neutral mass spectrometry depth profiling in Ag/Au and Ag/Pd nanocrystalline thin film systems. It is shown that the compositions in zones left behind the moving boundaries can be determined by this te...

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Detalles Bibliográficos
Autores principales: Molnár, Gábor Y, Shenouda, Shenouda S, Katona, Gábor L, Langer, Gábor A, Beke, Dezső L
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2016
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4901547/
https://www.ncbi.nlm.nih.gov/pubmed/27335738
http://dx.doi.org/10.3762/bjnano.7.41

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4901547/
https://www.ncbi.nlm.nih.gov/pubmed/27335738
http://dx.doi.org/10.3762/bjnano.7.41

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