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Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air
Frequency-modulation atomic force microscopy has turned into a well-established method to obtain atomic resolution on flat surfaces, but is often limited to ultra-high vacuum conditions and cryogenic temperatures. Measurements under ambient conditions are influenced by variations of the dew point an...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4901554/ https://www.ncbi.nlm.nih.gov/pubmed/27335735 http://dx.doi.org/10.3762/bjnano.7.38 |