Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995

Detalles Bibliográficos
Autores principales: Dagata, John A., Diebold, Alain C., Ken Shih, C. K., Colton, Richard J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907606/
https://www.ncbi.nlm.nih.gov/pubmed/27805094
http://dx.doi.org/10.6028/jres.101.009

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907606/
https://www.ncbi.nlm.nih.gov/pubmed/27805094
http://dx.doi.org/10.6028/jres.101.009

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