Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995

Detalles Bibliográficos
Autores principales: Dagata, John A., Diebold, Alain C., Ken Shih, C. K., Colton, Richard J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907606/
https://www.ncbi.nlm.nih.gov/pubmed/27805094
http://dx.doi.org/10.6028/jres.101.009
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author Dagata, John A.
Diebold, Alain C.
Ken Shih, C. K.
Colton, Richard J.
author_facet Dagata, John A.
Diebold, Alain C.
Ken Shih, C. K.
Colton, Richard J.
author_sort Dagata, John A.
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spelling pubmed-49076062016-10-28 Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995 Dagata, John A. Diebold, Alain C. Ken Shih, C. K. Colton, Richard J. J Res Natl Inst Stand Technol Article [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996 /pmc/articles/PMC4907606/ /pubmed/27805094 http://dx.doi.org/10.6028/jres.101.009 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Dagata, John A.
Diebold, Alain C.
Ken Shih, C. K.
Colton, Richard J.
Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
title Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
title_full Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
title_fullStr Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
title_full_unstemmed Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
title_short Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
title_sort conference report: second workshop on industrial applications of scanned probe microscopy gaithersburg, md may 2–3, 1995
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907606/
https://www.ncbi.nlm.nih.gov/pubmed/27805094
http://dx.doi.org/10.6028/jres.101.009
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