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Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
Autores principales: | Dagata, John A., Diebold, Alain C., Ken Shih, C. K., Colton, Richard J. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1996
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907606/ https://www.ncbi.nlm.nih.gov/pubmed/27805094 http://dx.doi.org/10.6028/jres.101.009 |
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