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Theory of Electron Beam Moiré

When a specimen surface carrying a high-frequency line grating is examined under a scanning electron microscope (SEM), moiré fringes are observed at several different magnifications. The fringes are characterized by their spatial frequency, orientation, and contrast. These features of the moiré patt...

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Detalles Bibliográficos
Autores principales: Read, David T., Dally, James W.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907608/
https://www.ncbi.nlm.nih.gov/pubmed/27805092
http://dx.doi.org/10.6028/jres.101.007