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X-Ray Diffraction Line Broadening: Modeling and Applications to High-T(c) Superconductors
A method to analyze powder-diffraction line broadening is proposed and applied to some novel high-T(c) superconductors. Assuming that both size-broadened and strain-broadened profiles of the pure-specimen profile are described with a Voigt function, it is shown that the analysis of Fourier coefficie...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1993
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4914239/ https://www.ncbi.nlm.nih.gov/pubmed/28053477 http://dx.doi.org/10.6028/jres.098.026 |