Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction

The built-in piezoelectric fields in group III-nitrides can act as road blocks on the way to maximizing the efficiency of opto-electronic devices. In order to overcome this limitation, a proper characterization of these fields is necessary. In this work nano-beam electron diffraction in scanning tra...

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Autores principales: Carvalho, Daniel, Müller-Caspary, Knut, Schowalter, Marco, Grieb, Tim, Mehrtens, Thorsten, Rosenauer, Andreas, Ben, Teresa, García, Rafael, Redondo-Cubero, Andrés, Lorenz, Katharina, Daudin, Bruno, Morales, Francisco M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4923855/
https://www.ncbi.nlm.nih.gov/pubmed/27350322
http://dx.doi.org/10.1038/srep28459
_version_ 1782439765974450176
author Carvalho, Daniel
Müller-Caspary, Knut
Schowalter, Marco
Grieb, Tim
Mehrtens, Thorsten
Rosenauer, Andreas
Ben, Teresa
García, Rafael
Redondo-Cubero, Andrés
Lorenz, Katharina
Daudin, Bruno
Morales, Francisco M.
author_facet Carvalho, Daniel
Müller-Caspary, Knut
Schowalter, Marco
Grieb, Tim
Mehrtens, Thorsten
Rosenauer, Andreas
Ben, Teresa
García, Rafael
Redondo-Cubero, Andrés
Lorenz, Katharina
Daudin, Bruno
Morales, Francisco M.
author_sort Carvalho, Daniel
collection PubMed
description The built-in piezoelectric fields in group III-nitrides can act as road blocks on the way to maximizing the efficiency of opto-electronic devices. In order to overcome this limitation, a proper characterization of these fields is necessary. In this work nano-beam electron diffraction in scanning transmission electron microscopy mode has been used to simultaneously measure the strain state and the induced piezoelectric fields in a GaN/AlN multiple quantum well system.
format Online
Article
Text
id pubmed-4923855
institution National Center for Biotechnology Information
language English
publishDate 2016
publisher Nature Publishing Group
record_format MEDLINE/PubMed
spelling pubmed-49238552016-06-28 Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction Carvalho, Daniel Müller-Caspary, Knut Schowalter, Marco Grieb, Tim Mehrtens, Thorsten Rosenauer, Andreas Ben, Teresa García, Rafael Redondo-Cubero, Andrés Lorenz, Katharina Daudin, Bruno Morales, Francisco M. Sci Rep Article The built-in piezoelectric fields in group III-nitrides can act as road blocks on the way to maximizing the efficiency of opto-electronic devices. In order to overcome this limitation, a proper characterization of these fields is necessary. In this work nano-beam electron diffraction in scanning transmission electron microscopy mode has been used to simultaneously measure the strain state and the induced piezoelectric fields in a GaN/AlN multiple quantum well system. Nature Publishing Group 2016-06-28 /pmc/articles/PMC4923855/ /pubmed/27350322 http://dx.doi.org/10.1038/srep28459 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Carvalho, Daniel
Müller-Caspary, Knut
Schowalter, Marco
Grieb, Tim
Mehrtens, Thorsten
Rosenauer, Andreas
Ben, Teresa
García, Rafael
Redondo-Cubero, Andrés
Lorenz, Katharina
Daudin, Bruno
Morales, Francisco M.
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
title Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
title_full Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
title_fullStr Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
title_full_unstemmed Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
title_short Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
title_sort direct measurement of polarization-induced fields in gan/aln by nano-beam electron diffraction
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4923855/
https://www.ncbi.nlm.nih.gov/pubmed/27350322
http://dx.doi.org/10.1038/srep28459
work_keys_str_mv AT carvalhodaniel directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT mullercasparyknut directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT schowaltermarco directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT griebtim directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT mehrtensthorsten directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT rosenauerandreas directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT benteresa directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT garciarafael directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT redondocuberoandres directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT lorenzkatharina directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT daudinbruno directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction
AT moralesfranciscom directmeasurementofpolarizationinducedfieldsinganalnbynanobeamelectrondiffraction

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