In-situ Isotopic Analysis at Nanoscale using Parallel Ion Electron Spectrometry: A Powerful New Paradigm for Correlative Microscopy

Isotopic analysis is of paramount importance across the entire gamut of scientific research. To advance the frontiers of knowledge, a technique for nanoscale isotopic analysis is indispensable. Secondary Ion Mass Spectrometry (SIMS) is a well-established technique for analyzing isotopes, but its spa...

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Detalles Bibliográficos
Autores principales: Yedra, Lluís, Eswara, Santhana, Dowsett, David, Wirtz, Tom
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4923888/
https://www.ncbi.nlm.nih.gov/pubmed/27350565
http://dx.doi.org/10.1038/srep28705

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4923888/
https://www.ncbi.nlm.nih.gov/pubmed/27350565
http://dx.doi.org/10.1038/srep28705

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