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An Automated Reverse-Bias Second-Breakdown Transistor Tester
An automated instrument is described for generating curves for the reverse-bias, safe-operating area of transistors nondestructively. A new technique for detecting second breakdown that makes automation possible is highlighted. Methods to reduce stress to the device under test are discussed, as are...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1991
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4924891/ https://www.ncbi.nlm.nih.gov/pubmed/28184116 http://dx.doi.org/10.6028/jres.096.016 |