An Automated Reverse-Bias Second-Breakdown Transistor Tester

An automated instrument is described for generating curves for the reverse-bias, safe-operating area of transistors nondestructively. A new technique for detecting second breakdown that makes automation possible is highlighted. Methods to reduce stress to the device under test are discussed, as are...

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Detalles Bibliográficos
Autor principal: Berning, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1991
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4924891/
https://www.ncbi.nlm.nih.gov/pubmed/28184116
http://dx.doi.org/10.6028/jres.096.016
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author Berning, David
author_facet Berning, David
author_sort Berning, David
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description An automated instrument is described for generating curves for the reverse-bias, safe-operating area of transistors nondestructively. A new technique for detecting second breakdown that makes automation possible is highlighted. Methods to reduce stress to the device under test are discussed, as are several other innovations that enhance automation. Measurements using the tester are described, and limitations on nondestructive testability are discussed.
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spelling pubmed-49248912017-02-09 An Automated Reverse-Bias Second-Breakdown Transistor Tester Berning, David J Res Natl Inst Stand Technol Article An automated instrument is described for generating curves for the reverse-bias, safe-operating area of transistors nondestructively. A new technique for detecting second breakdown that makes automation possible is highlighted. Methods to reduce stress to the device under test are discussed, as are several other innovations that enhance automation. Measurements using the tester are described, and limitations on nondestructive testability are discussed. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1991 /pmc/articles/PMC4924891/ /pubmed/28184116 http://dx.doi.org/10.6028/jres.096.016 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Berning, David
An Automated Reverse-Bias Second-Breakdown Transistor Tester
title An Automated Reverse-Bias Second-Breakdown Transistor Tester
title_full An Automated Reverse-Bias Second-Breakdown Transistor Tester
title_fullStr An Automated Reverse-Bias Second-Breakdown Transistor Tester
title_full_unstemmed An Automated Reverse-Bias Second-Breakdown Transistor Tester
title_short An Automated Reverse-Bias Second-Breakdown Transistor Tester
title_sort automated reverse-bias second-breakdown transistor tester
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4924891/
https://www.ncbi.nlm.nih.gov/pubmed/28184116
http://dx.doi.org/10.6028/jres.096.016
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