Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part III: Interpolating and Extrapolating Internal Quantum-Efficiency Calibrations

The semiconductor device modeling program PC-ID and the programs that support its use in high-accuracy modeling of photodiodes, all of which were described in Part I of this series of papers, are used to simulate the interpolation of high-accuracy internal quantum-efficiency calibrations in the spec...

Descripción completa

Detalles Bibliográficos
Autores principales: Geist, Jon, Robinson, A. M., James, C. R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1991
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4930054/
https://www.ncbi.nlm.nih.gov/pubmed/28184124
http://dx.doi.org/10.6028/jres.096.025

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4930054/
https://www.ncbi.nlm.nih.gov/pubmed/28184124
http://dx.doi.org/10.6028/jres.096.025

Ejemplares similares