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Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits
We demonstrate how the need to cope with operational faults enables evolving circuits to find more fit solutions. The analysis of the results obtained in different experimental conditions indicates that, in absence of faults, evolution tends to select circuits that are small and have low phenotypic...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Public Library of Science
2016
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4943595/ https://www.ncbi.nlm.nih.gov/pubmed/27409589 http://dx.doi.org/10.1371/journal.pone.0158627 |