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Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits
We demonstrate how the need to cope with operational faults enables evolving circuits to find more fit solutions. The analysis of the results obtained in different experimental conditions indicates that, in absence of faults, evolution tends to select circuits that are small and have low phenotypic...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Public Library of Science
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4943595/ https://www.ncbi.nlm.nih.gov/pubmed/27409589 http://dx.doi.org/10.1371/journal.pone.0158627 |
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author | Milano, Nicola Nolfi, Stefano |
author_facet | Milano, Nicola Nolfi, Stefano |
author_sort | Milano, Nicola |
collection | PubMed |
description | We demonstrate how the need to cope with operational faults enables evolving circuits to find more fit solutions. The analysis of the results obtained in different experimental conditions indicates that, in absence of faults, evolution tends to select circuits that are small and have low phenotypic variability and evolvability. The need to face operation faults, instead, drives evolution toward the selection of larger circuits that are truly robust with respect to genetic variations and that have a greater level of phenotypic variability and evolvability. Overall our results indicate that the need to cope with operation faults leads to the selection of circuits that have a greater probability to generate better circuits as a result of genetic variation with respect to a control condition in which circuits are not subjected to faults. |
format | Online Article Text |
id | pubmed-4943595 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Public Library of Science |
record_format | MEDLINE/PubMed |
spelling | pubmed-49435952016-08-01 Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits Milano, Nicola Nolfi, Stefano PLoS One Research Article We demonstrate how the need to cope with operational faults enables evolving circuits to find more fit solutions. The analysis of the results obtained in different experimental conditions indicates that, in absence of faults, evolution tends to select circuits that are small and have low phenotypic variability and evolvability. The need to face operation faults, instead, drives evolution toward the selection of larger circuits that are truly robust with respect to genetic variations and that have a greater level of phenotypic variability and evolvability. Overall our results indicate that the need to cope with operation faults leads to the selection of circuits that have a greater probability to generate better circuits as a result of genetic variation with respect to a control condition in which circuits are not subjected to faults. Public Library of Science 2016-07-13 /pmc/articles/PMC4943595/ /pubmed/27409589 http://dx.doi.org/10.1371/journal.pone.0158627 Text en © 2016 Milano, Nolfi http://creativecommons.org/licenses/by/4.0/ This is an open access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited. |
spellingShingle | Research Article Milano, Nicola Nolfi, Stefano Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits |
title | Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits |
title_full | Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits |
title_fullStr | Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits |
title_full_unstemmed | Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits |
title_short | Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits |
title_sort | robustness to faults promotes evolvability: insights from evolving digital circuits |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4943595/ https://www.ncbi.nlm.nih.gov/pubmed/27409589 http://dx.doi.org/10.1371/journal.pone.0158627 |
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