Electrical Characterization of Amorphous Silicon MIS-Based Structures for HIT Solar Cell Applications

A complete electrical characterization of hydrogenated amorphous silicon layers (a-Si:H) deposited on crystalline silicon (c-Si) substrates by electron cyclotron resonance chemical vapor deposition (ECR-CVD) was carried out. These structures are of interest for photovoltaic applications. Different g...

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Detalles Bibliográficos
Autores principales: García, Héctor, Castán, Helena, Dueñas, Salvador, Bailón, Luis, García-Hernansanz, Rodrigo, Olea, Javier, del Prado, Álvaro, Mártil, Ignacio
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2016
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4947466/
https://www.ncbi.nlm.nih.gov/pubmed/27423876
http://dx.doi.org/10.1186/s11671-016-1545-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4947466/
https://www.ncbi.nlm.nih.gov/pubmed/27423876
http://dx.doi.org/10.1186/s11671-016-1545-z

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